CVE-2019-2247 in Snapdragon Auto
Summary
by MITRE
Possibility of double free issue while running multiple instances of smp2p test because of proper protection is missing while using global variable in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon IoT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables in MDM9150, MDM9206, MDM9607, MDM9640, MDM9650, MSM8909W, MSM8996AU, QCS605, Qualcomm 215, SD 210/SD 212/SD 205, SD 425, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 632, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20, SDX24
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Analysis
by VulDB Data Team • 06/16/2020
The vulnerability identified as CVE-2019-2247 represents a critical double free issue within Qualcomm's Snapdragon automotive, consumer IoT, industrial IoT, mobile, voice, and wearable platforms. This flaw manifests when multiple instances of smp2p test execute concurrently, exposing a fundamental race condition in the handling of global variables. The vulnerability stems from inadequate synchronization mechanisms that fail to properly protect shared resources during multi-threaded operations, creating an exploitable scenario where memory management functions can be invoked twice on the same memory block. The affected chipsets span a broad range of Qualcomm's product portfolio including the MDM9150, MDM9206, MDM9607, MDM9640, MDM9650, MSM8909W, MSM8996AU, QCS605, Qualcomm 215, SD 210/SD 212/SD 205, SD 425, SD 439/SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 632, SD 636, SD 650/52, SD 712/SD 710/SD 670, SD 820A, SD 835, SD 845/SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20, and SDX24 platforms.
This technical flaw directly maps to CWE-415, which describes double free conditions where a program attempts to free the same memory block twice, and CWE-416, which addresses use after free vulnerabilities. The operational impact of this vulnerability extends beyond simple memory corruption, as it creates potential for arbitrary code execution and system instability. When multiple smp2p test instances run simultaneously, the absence of proper mutex locks or atomic operations around global variable access allows concurrent threads to manipulate the same memory location, leading to the double free scenario. The vulnerability is particularly concerning in automotive and industrial applications where system reliability and safety are paramount, as it could potentially be exploited to compromise vehicle systems or industrial control networks.
The exploitation of this vulnerability requires concurrent execution of multiple smp2p test instances, which creates a race condition in the memory management subsystem. Attackers could leverage this weakness to corrupt heap structures, potentially leading to privilege escalation or denial of service conditions. The impact is amplified by the widespread deployment of affected chipsets across various device categories, from smartphones and tablets to automotive systems and IoT devices. Organizations should prioritize immediate patching of affected systems and implement monitoring for unusual memory management patterns. The vulnerability demonstrates the critical importance of proper synchronization mechanisms in embedded systems, particularly in automotive environments where security and reliability are non-negotiable requirements. Mitigation strategies should include code-level fixes to implement proper locking mechanisms, runtime memory protection features, and comprehensive testing of multi-threaded applications in automotive and IoT contexts. This vulnerability highlights the need for adherence to secure coding practices and proper memory management protocols in complex embedded systems, as outlined in the ATT&CK framework's system binary permissions and privilege escalation techniques.