CVE-2025-59606 in Snapdragon Auto

Sumário

de MITRE • 02/06/2026

Memory Corruption when writing to invalid memory locations occurs due to heap memory exhaustion during secure data initialization.

If you want to get best quality of vulnerability data, you may have to visit VulDB.

• Responsável: Qualcomm
• Reservar: 18/09/2025
• Divulgação: 02/06/2026
• Moderação: aceite
• Entrada: VDB-367783
• CPE: pronto
• CWE: CWE-476 (confirmado)
• CVSS: 7.8 (CNA)
• EPSS: 0.00011
• KEV: não
• Atividades: baixo
• Sector: Hospital, Telecommunication, ...

Fontes

• MITRE: https://www.cve.org/CVERecord?id=CVE-2025-59606
• NVD: https://nvd.nist.gov/vuln/detail/CVE-2025-59606
• CVE Details: https://www.cvedetails.com/cve/CVE-2025-59606/