CVE-2025-59606 in Snapdragon Autoinfo

Zusammenfassung

von MITRE • 02.06.2026

Memory Corruption when writing to invalid memory locations occurs due to heap memory exhaustion during secure data initialization.

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An in-depth analysis is available in our curated vulnerability entry.

Zuständig

Qualcomm

Reservieren

18.09.2025

Veröffentlichung

02.06.2026

Moderieren

akzeptiert

Eintrag

VDB-367783

CPE

bereit

EPSS

0.00011

KEV

nein

Aktivitäten

low

Sektor

Hospital, Pharma, ...

Quellen

MITREhttps://www.cve.org/CVERecord?id=CVE-2025-59606
NVDhttps://nvd.nist.gov/vuln/detail/CVE-2025-59606
CVE Detailshttps://www.cvedetails.com/cve/CVE-2025-59606/

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