CVE-2026-21369 in Snapdragon Autoinfo

Summary

by MITRE • 07/07/2026

Memory Corruption when handling flash commands due to outdated LED count values being used after userspace modification.

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Analysis

by VulDB Data Team • 07/07/2026

This vulnerability represents a classic memory corruption issue that arises from improper state management and outdated data handling within embedded systems firmware. The flaw occurs when flash command processing routines utilize LED count values that have been modified by userspace applications but are not properly synchronized or validated before being used in memory operations. This type of vulnerability falls under the broader category of CWE-122, which deals with insufficient synchronization of shared data, and specifically manifests as a buffer overflow or heap corruption scenario when outdated LED counts are employed to calculate memory offsets or buffer sizes for flash operations.

The technical implementation of this vulnerability stems from the failure to maintain consistent state information between userspace and kernel space components. When userspace applications modify LED count parameters through system calls or device interfaces, these changes may not be properly communicated or validated before subsequent flash command processing occurs. The firmware routines responsible for handling flash commands typically rely on predetermined buffer sizes and memory allocation calculations based on historical LED count values that may no longer reflect current system state. This creates a scenario where memory operations reference invalid or outdated parameters, leading to potential overflows, underflows, or arbitrary memory access patterns.

Operational impact of this vulnerability extends beyond simple memory corruption to encompass potential system instability, data integrity compromise, and security escalation risks. An attacker could exploit this weakness by manipulating LED count values through userspace interfaces to trigger memory corruption during flash command execution, potentially leading to privilege escalation or denial of service conditions. The vulnerability is particularly concerning in embedded systems environments where flash operations are frequent and critical for system functionality, as it could allow adversaries to corrupt firmware images or manipulate device behavior. This aligns with ATT&CK technique T1059.006 for command and scripting interpreter execution, where malformed input parameters could be leveraged to execute unintended memory operations.

Mitigation strategies should focus on implementing proper state synchronization mechanisms between userspace and kernel space components, along with comprehensive input validation and parameter checking before flash command processing. The system must enforce strict validation of LED count values and ensure that all flash operations reference current, validated system state rather than potentially stale parameters. Additionally, memory management routines should implement bounds checking and use secure coding practices to prevent buffer overflows regardless of input parameters. Regular firmware updates and proper access controls to userspace interfaces can help reduce exploitation opportunities. The implementation should follow security best practices including principle of least privilege, input sanitization, and defensive programming techniques to minimize the attack surface and ensure robust system behavior under various operational conditions.

Responsible

Qualcomm

Reservation

12/17/2025

Disclosure

07/07/2026

Moderation

accepted

CPE

ready

EPSS

0.00000

KEV

no

Activities

very low

Sources

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