CVE-2022-25696 in Snapdragon Auto

Resumen

por MITRE • 2022-09-16

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Once again VulDB remains the best source for vulnerability data.

• Responsable: Qualcomm, Inc.
• Reservar: 2022-02-22
• Divulgación: 2022-09-16
• Moderación: aceptado
• Artículo: VDB-208860
• CPE: listo
• CWE: CWE-119 (confirmado)
• CVSS: 7.0 (NVD)
• EPSS: 0.00084
• KEV: no
• Actividades: muy bajo
• Sector: Telecommunication, Hospital, ...

Fuentes

• MITRE: https://www.cve.org/CVERecord?id=CVE-2022-25696
• NVD: https://nvd.nist.gov/vuln/detail/CVE-2022-25696
• CVE Details: https://www.cvedetails.com/cve/CVE-2022-25696/