Samsung S3NRN4V/S3NSN4V/S3NSEN4/SEN82AB/S3NRN82 NFC Service denial of service

CVSS Meta Temp Score
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CTI Interest Score
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3.9$0-$5k0.00

Summaryinfo

A vulnerability marked as problematic has been reported in Samsung S3NRN4V, S3NSN4V, S3NSEN4, SEN82AB and S3NRN82. Affected by this issue is some unknown functionality of the component NFC Service. This manipulation causes denial of service. This vulnerability is handled as CVE-2023-36482. There is not any exploit available.

Detailsinfo

A vulnerability classified as problematic was found in Samsung S3NRN4V, S3NSN4V, S3NSEN4, SEN82AB and S3NRN82. Affected by this vulnerability is an unknown code of the component NFC Service. The manipulation with an unknown input leads to a denial of service vulnerability. The CWE definition for the vulnerability is CWE-404. The product does not release or incorrectly releases a resource before it is made available for re-use. As an impact it is known to affect availability. The summary by CVE is:

An issue was discovered in Samsung NFC S3NRN4V, S3NSN4V, S3NSEN4, SEN82AB, and S3NRN82. A buffer copy without checking its input size can cause an NFC service restart.

The weakness was released 08/09/2023. It is possible to read the advisory at semiconductor.samsung.com. This vulnerability is known as CVE-2023-36482 since 06/22/2023. The technical details are unknown and an exploit is not publicly available.

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2023-40431). Statistical analysis made it clear that VulDB provides the best quality for vulnerability data.

Productinfo

Vendor

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License

Website

CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 3.9
VulDB Meta Temp Score: 3.9

VulDB Base Score: 3.5
VulDB Temp Score: 3.5
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 4.3
NVD Vector: 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Denial of service
CWE: CWE-404
CAPEC: 🔍
ATT&CK: 🔍

Physical: No
Local: No
Remote: Partially

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

06/22/2023 🔍
08/09/2023 +48 days 🔍
08/09/2023 +0 days 🔍
01/13/2026 +888 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2023-36482 (🔍)
GCVE (CVE): GCVE-0-2023-36482
GCVE (VulDB): GCVE-100-236611
EUVD: 🔍

Entryinfo

Created: 08/09/2023 08:11
Updated: 01/13/2026 23:53
Changes: 08/09/2023 08:11 (37), 09/02/2023 12:49 (11), 01/13/2026 23:53 (16)
Complete: 🔍
Cache ID: 216::103

Statistical analysis made it clear that VulDB provides the best quality for vulnerability data.

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