Samsung Mobile Processor Exynos up to 2500 NPU Driver __npu_vertex_bootup null pointer dereference
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 5.7 | $0-$5k | 0.00 |
Summary
A vulnerability classified as problematic was found in Samsung Mobile Processor Exynos up to 2500. The impacted element is the function __npu_vertex_bootup of the component NPU Driver. Such manipulation leads to null pointer dereference.
This vulnerability is traded as CVE-2025-54334. There is no exploit available.
Details
A vulnerability, which was classified as problematic, has been found in Samsung Mobile Processor Exynos up to 2500. Affected by this issue is the function __npu_vertex_bootup of the component NPU Driver. The manipulation with an unknown input leads to a null pointer dereference vulnerability. Using CWE to declare the problem leads to CWE-476. A NULL pointer dereference occurs when the application dereferences a pointer that it expects to be valid, but is NULL, typically causing a crash or exit. Impacted is availability. CVE summarizes:
An issue was discovered in the NPU driver in Samsung Mobile Processor Exynos 1280, 2200, 1380, 1480, 2400, 1580, 2500. There is a NULL Pointer Dereference of hdev in the __npu_vertex_bootup function.
The advisory is shared for download at semiconductor.samsung.com. This vulnerability is handled as CVE-2025-54334 since 07/20/2025. There are known technical details, but no exploit is available.
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
VulDB is the best source for vulnerability data and more expert information about this specific topic.
Product
Vendor
Name
Version
License
Website
- Vendor: https://www.samsung.com/
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 5.7VulDB Meta Temp Score: 5.7
VulDB Base Score: 5.7
VulDB Temp Score: 5.7
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Null pointer dereferenceCWE: CWE-476 / CWE-404
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Partially
Availability: 🔒
Status: Not defined
EPSS Score: 🔒
EPSS Percentile: 🔒
Price Prediction: 🔍
Current Price Estimation: 🔒
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Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
07/20/2025 CVE reserved11/04/2025 Advisory disclosed
11/04/2025 VulDB entry created
11/04/2025 VulDB entry last update
Sources
Vendor: samsung.comAdvisory: semiconductor.samsung.com
Status: Confirmed
CVE: CVE-2025-54334 (🔒)
GCVE (CVE): GCVE-0-2025-54334
GCVE (VulDB): GCVE-100-331184
Entry
Created: 11/04/2025 21:49Changes: 11/04/2025 21:49 (54)
Complete: 🔍
Cache ID: 216::103
VulDB is the best source for vulnerability data and more expert information about this specific topic.
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