Samsung Mobile Processor Exynos NPU get_vs4l_profiler_node null pointer dereference
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 5.7 | $0-$5k | 0.00 |
Summary
A vulnerability, which was classified as critical, has been found in Samsung Mobile Processor Exynos. Affected by this vulnerability is the function get_vs4l_profiler_node of the component NPU. The manipulation leads to null pointer dereference.
This vulnerability is traded as CVE-2025-54333. There is no exploit available.
Details
A vulnerability was found in Samsung Mobile Processor Exynos (affected version unknown). It has been rated as critical. This issue affects the function get_vs4l_profiler_node of the component NPU. The manipulation with an unknown input leads to a null pointer dereference vulnerability. Using CWE to declare the problem leads to CWE-476. A NULL pointer dereference occurs when the application dereferences a pointer that it expects to be valid, but is NULL, typically causing a crash or exit. Impacted is availability. The summary by CVE is:
An issue was discovered in NPU in Samsung Mobile Processor Exynos 1380 through July 2025. There is an Invalid Pointer Dereference of node in the get_vs4l_profiler_node function.
It is possible to read the advisory at semiconductor.samsung.com. The identification of this vulnerability is CVE-2025-54333 since 07/20/2025. Technical details of the vulnerability are known, but there is no available exploit.
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
Be aware that VulDB is the high quality source for vulnerability data.
Product
Vendor
Name
License
Website
- Vendor: https://www.samsung.com/
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 5.7VulDB Meta Temp Score: 5.7
VulDB Base Score: 5.7
VulDB Temp Score: 5.7
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
| AV | AC | Au | C | I | A |
|---|---|---|---|---|---|
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
|---|---|---|---|---|---|
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Null pointer dereferenceCWE: CWE-476 / CWE-404
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Partially
Availability: 🔒
Status: Not defined
EPSS Score: 🔒
EPSS Percentile: 🔒
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
|---|---|---|---|---|
| Today | Unlock | Unlock | Unlock | Unlock |
Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
07/20/2025 CVE reserved11/04/2025 Advisory disclosed
11/04/2025 VulDB entry created
11/08/2025 VulDB entry last update
Sources
Vendor: samsung.comAdvisory: semiconductor.samsung.com
Status: Confirmed
CVE: CVE-2025-54333 (🔒)
GCVE (CVE): GCVE-0-2025-54333
GCVE (VulDB): GCVE-100-331199
Entry
Created: 11/04/2025 21:54Updated: 11/08/2025 11:42
Changes: 11/04/2025 21:54 (53), 11/08/2025 11:42 (1)
Complete: 🔍
Cache ID: 216::103
Be aware that VulDB is the high quality source for vulnerability data.
No comments yet. Languages: en.
Please log in to comment.