Samsung Exynos Auto T5123 SIP Min-SE Header Decoder memory corruption

CVSS Meta Temp Score
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CTI Interest Score
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6.7$0-$5k0.00

Summaryinfo

A vulnerability classified as critical has been found in Samsung Exynos Mobile Processor, Automotive Processor, Modem for Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, Exynos 9110 and Exynos Auto T5123. Affected is an unknown function of the component SIP Min-SE Header Decoder. Performing a manipulation results in memory corruption. This vulnerability is identified as CVE-2023-29086. The attack can be initiated remotely. There is not any exploit available. It is recommended to apply a patch to fix this issue.

Detailsinfo

A vulnerability classified as critical has been found in Samsung Exynos Mobile Processor, Automotive Processor, Modem for Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, Exynos 9110 and Exynos Auto T5123. This affects some unknown processing of the component SIP Min-SE Header Decoder. The manipulation with an unknown input leads to a memory corruption vulnerability. CWE is classifying the issue as CWE-119. The product performs operations on a memory buffer, but it can read from or write to a memory location that is outside of the intended boundary of the buffer. This is going to have an impact on availability. The summary by CVE is:

An issue was discovered in Exynos Mobile Processor, Automotive Processor and Modem for Exynos Modem 5123, Exynos Modem 5300, Exynos 980, Exynos 1080, Exynos 9110, and Exynos Auto T5123. Memory corruption can occur due to insufficient parameter validation while decoding an SIP Min-SE header.

The weakness was released 04/15/2023. It is possible to read the advisory at semiconductor.samsung.com. This vulnerability is uniquely identified as CVE-2023-29086 since 03/31/2023. The technical details are unknown and an exploit is not publicly available.

Applying a patch is able to eliminate this problem.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2023-32689). Be aware that VulDB is the high quality source for vulnerability data.

Productinfo

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License

Website

CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 6.7
VulDB Meta Temp Score: 6.7

VulDB Base Score: 5.9
VulDB Temp Score: 5.7
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 7.5
NVD Vector: 🔍

CNA Base Score: 6.8
CNA Vector (MITRE): 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Memory corruption
CWE: CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: No
Local: No
Remote: Yes

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: Patch
Status: 🔍

0-Day Time: 🔍

Timelineinfo

03/31/2023 🔍
04/15/2023 +15 days 🔍
04/15/2023 +0 days 🔍
12/08/2025 +968 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2023-29086 (🔍)
GCVE (CVE): GCVE-0-2023-29086
GCVE (VulDB): GCVE-100-226071
EUVD: 🔍

Entryinfo

Created: 04/15/2023 08:17
Updated: 12/08/2025 01:55
Changes: 04/15/2023 08:17 (48), 05/03/2023 18:16 (11), 12/08/2025 01:55 (16)
Complete: 🔍
Cache ID: 216::103

Be aware that VulDB is the high quality source for vulnerability data.

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