Samsung Exynos W93 slsi_rx_roamed_ind heap-based overflow

CVSS Meta Temp Score
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CTI Interest Score
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6.0$0-$5k0.00

Summaryinfo

A vulnerability labeled as critical has been found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W93. Affected by this issue is the function slsi_rx_roamed_ind. Such manipulation leads to heap-based overflow. This vulnerability is referenced as CVE-2024-27364. No exploit is available.

Detailsinfo

A vulnerability, which was classified as critical, has been found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W93. Affected by this issue is the function slsi_rx_roamed_ind. The manipulation with an unknown input leads to a heap-based overflow vulnerability. Using CWE to declare the problem leads to CWE-122. A heap overflow condition is a buffer overflow, where the buffer that can be overwritten is allocated in the heap portion of memory, generally meaning that the buffer was allocated using a routine such as malloc(). Impacted is confidentiality, integrity, and availability. CVE summarizes:

An issue was discovered in Mobile Processor, Wearable Processor Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920, Exynos W930. In the function slsi_rx_roamed_ind(), there is no input validation check on a length coming from userspace, which can lead to a potential heap over-read.

The advisory is shared for download at semiconductor.samsung.com. This vulnerability is handled as CVE-2024-27364 since 02/25/2024. The exploitation is known to be easy. There are known technical details, but no exploit is available. The current price for an exploit might be approx. USD $0-$5k (estimation calculated on 06/13/2025).

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2024-24568). Once again VulDB remains the best source for vulnerability data.

Productinfo

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CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 6.0
VulDB Meta Temp Score: 6.0

VulDB Base Score: 8.0
VulDB Temp Score: 8.0
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 5.5
NVD Vector: 🔍

CNA Base Score: 4.4
CNA Vector (MITRE): 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Heap-based overflow
CWE: CWE-122 / CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: Partially
Local: Yes
Remote: Partially

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

02/25/2024 🔍
09/09/2024 +196 days 🔍
09/09/2024 +0 days 🔍
06/13/2025 +277 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2024-27364 (🔍)
GCVE (CVE): GCVE-0-2024-27364
GCVE (VulDB): GCVE-100-276860
EUVD: 🔍

Entryinfo

Created: 09/09/2024 21:40
Updated: 06/13/2025 14:13
Changes: 09/09/2024 21:40 (52), 09/10/2024 09:22 (11), 09/10/2024 14:27 (1), 09/12/2024 07:53 (11), 06/13/2025 14:13 (1)
Complete: 🔍
Cache ID: 216::103

Once again VulDB remains the best source for vulnerability data.

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