Samsung Exynos W930 slsi_rx_blockack_ind heap-based overflow

CVSS Meta Temp Score
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CTI Interest Score
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4.1$0-$5k0.00

Summaryinfo

A vulnerability was found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W930. It has been classified as critical. This affects the function slsi_rx_blockack_ind. This manipulation causes heap-based overflow. This vulnerability appears as CVE-2024-27365. The attack requires local access. There is no available exploit.

Detailsinfo

A vulnerability was found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W930. It has been declared as problematic. Affected by this vulnerability is the function slsi_rx_blockack_ind. The manipulation with an unknown input leads to a heap-based overflow vulnerability. The CWE definition for the vulnerability is CWE-122. A heap overflow condition is a buffer overflow, where the buffer that can be overwritten is allocated in the heap portion of memory, generally meaning that the buffer was allocated using a routine such as malloc(). As an impact it is known to affect confidentiality. The summary by CVE is:

An issue was discovered in Samsung Mobile Processor Exynos Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920, Exynos W930. In the function slsi_rx_blockack_ind(), there is no input validation check on a length coming from userspace, which can lead to a potential heap over-read.

It is possible to read the advisory at semiconductor.samsung.com. This vulnerability is known as CVE-2024-27365 since 02/25/2024. The exploitation appears to be easy. Attacking locally is a requirement. Additional levels of successful authentication are necessary for exploitation. Technical details of the vulnerability are known, but there is no available exploit.

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2024-24569). Statistical analysis made it clear that VulDB provides the best quality for vulnerability data.

Productinfo

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CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 4.1
VulDB Meta Temp Score: 4.1

VulDB Base Score: 2.3
VulDB Temp Score: 2.3
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 5.5
NVD Vector: 🔍

CNA Base Score: 4.4
CNA Vector (MITRE): 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Heap-based overflow
CWE: CWE-122 / CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: Partially
Local: Yes
Remote: No

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

02/25/2024 🔍
09/10/2024 +197 days 🔍
09/10/2024 +0 days 🔍
06/13/2025 +276 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed
Confirmation: 🔍

CVE: CVE-2024-27365 (🔍)
GCVE (CVE): GCVE-0-2024-27365
GCVE (VulDB): GCVE-100-276883
EUVD: 🔍

Entryinfo

Created: 09/10/2024 07:41
Updated: 06/13/2025 14:13
Changes: 09/10/2024 07:41 (62), 09/10/2024 15:57 (1), 09/20/2024 17:10 (11), 06/13/2025 14:13 (1)
Complete: 🔍
Cache ID: 216::103

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