Samsung Exynos 1330 slsi_rx_range_done_ind heap-based overflow

CVSS Meta Temp Score
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Current Exploit Price (≈)
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CTI Interest Score
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7.1$0-$5k0.00

Summaryinfo

A vulnerability was found in Samsung Exynos 980, Exynos 850, Exynos 1280, Exynos 1380 and Exynos 1330 and classified as critical. Affected by this issue is the function slsi_rx_range_done_ind. The manipulation results in heap-based overflow. This vulnerability is reported as CVE-2024-27387. The attack requires a local approach. No exploit exists.

Detailsinfo

A vulnerability was found in Samsung Exynos 980, Exynos 850, Exynos 1280, Exynos 1380 and Exynos 1330. It has been classified as critical. Affected is the function slsi_rx_range_done_ind. The manipulation with an unknown input leads to a heap-based overflow vulnerability. CWE is classifying the issue as CWE-122. A heap overflow condition is a buffer overflow, where the buffer that can be overwritten is allocated in the heap portion of memory, generally meaning that the buffer was allocated using a routine such as malloc(). This is going to have an impact on confidentiality, integrity, and availability. CVE summarizes:

An issue was discovered in Samsung Mobile Processor Exynos 980, Exynos 850, Exynos 1280, Exynos 1380, and Exynos 1330. In the function slsi_rx_range_done_ind(), there is no input validation check on rtt_id coming from userspace, which can lead to a heap overwrite.

The advisory is available at semiconductor.samsung.com. This vulnerability is traded as CVE-2024-27387 since 02/25/2024. The exploitability is told to be easy. Local access is required to approach this attack. Additional levels of successful authentication are required for exploitation. Technical details are known, but there is no available exploit. The structure of the vulnerability defines a possible price range of USD $0-$5k at the moment (estimation calculated on 06/13/2025).

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2024-24591). If you want to get best quality of vulnerability data, you may have to visit VulDB.

Productinfo

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Website

CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 7.1
VulDB Meta Temp Score: 7.1

VulDB Base Score: 6.7
VulDB Temp Score: 6.7
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 7.8
NVD Vector: 🔍

CNA Base Score: 6.7
CNA Vector (MITRE): 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Heap-based overflow
CWE: CWE-122 / CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: Partially
Local: Yes
Remote: No

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

02/25/2024 🔍
09/10/2024 +197 days 🔍
09/10/2024 +0 days 🔍
06/13/2025 +276 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2024-27387 (🔍)
GCVE (CVE): GCVE-0-2024-27387
GCVE (VulDB): GCVE-100-276882
EUVD: 🔍

Entryinfo

Created: 09/10/2024 07:41
Updated: 06/13/2025 14:21
Changes: 09/10/2024 07:41 (61), 09/10/2024 14:27 (1), 09/12/2024 08:18 (11), 06/13/2025 14:21 (1)
Complete: 🔍
Cache ID: 216::103

If you want to get best quality of vulnerability data, you may have to visit VulDB.

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