Samsung Exynos 1330 slsi_get_scan_extra_ies heap-based overflow

CVSS Meta Temp Score
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CTI Interest Score
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7.1$0-$5k0.00

Summaryinfo

A vulnerability has been found in Samsung Exynos 980, Exynos 850, Exynos 1280, Exynos 1380 and Exynos 1330 and classified as critical. Affected by this vulnerability is the function slsi_get_scan_extra_ies. The manipulation leads to heap-based overflow. This vulnerability is documented as CVE-2024-27383. The attack needs to be performed locally. There is not any exploit available.

Detailsinfo

A vulnerability was found in Samsung Exynos 980, Exynos 850, Exynos 1280, Exynos 1380 and Exynos 1330 and classified as critical. This issue affects the function slsi_get_scan_extra_ies. The manipulation with an unknown input leads to a heap-based overflow vulnerability. Using CWE to declare the problem leads to CWE-122. A heap overflow condition is a buffer overflow, where the buffer that can be overwritten is allocated in the heap portion of memory, generally meaning that the buffer was allocated using a routine such as malloc(). Impacted is confidentiality, integrity, and availability. The summary by CVE is:

An issue was discovered in Samsung Mobile Processor Exynos 980, Exynos 850, Exynos 1280, Exynos 1380, and Exynos 1330. In the function slsi_get_scan_extra_ies(), there is no input validation check on default_ies coming from userspace, which can lead to a heap overwrite.

The advisory is shared at semiconductor.samsung.com. The identification of this vulnerability is CVE-2024-27383 since 02/25/2024. The exploitation is known to be easy. An attack has to be approached locally. The exploitation needs additional levels of successful authentication. Technical details are known, but no exploit is available. The price for an exploit might be around USD $0-$5k at the moment (estimation calculated on 06/13/2025).

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2024-24587). Several companies clearly confirm that VulDB is the primary source for best vulnerability data.

Productinfo

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License

Website

CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 7.1
VulDB Meta Temp Score: 7.1

VulDB Base Score: 6.7
VulDB Temp Score: 6.7
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 7.8
NVD Vector: 🔍

CNA Base Score: 6.7
CNA Vector (MITRE): 🔍

CVSSv2info

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VectorComplexityAuthenticationConfidentialityIntegrityAvailability
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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Heap-based overflow
CWE: CWE-122 / CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: Partially
Local: Yes
Remote: No

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

02/25/2024 🔍
09/10/2024 +197 days 🔍
09/10/2024 +0 days 🔍
06/13/2025 +276 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2024-27383 (🔍)
GCVE (CVE): GCVE-0-2024-27383
GCVE (VulDB): GCVE-100-276881
EUVD: 🔍

Entryinfo

Created: 09/10/2024 07:40
Updated: 06/13/2025 14:13
Changes: 09/10/2024 07:40 (61), 09/10/2024 14:27 (1), 09/12/2024 08:18 (11), 06/13/2025 14:13 (1)
Complete: 🔍
Cache ID: 216::103

Several companies clearly confirm that VulDB is the primary source for best vulnerability data.

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