Samsung Exynos W930 slsi_rx_received_frame_ind heap-based overflow

CVSS Meta Temp Score
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4.1$0-$5k0.00

Summaryinfo

A vulnerability, which was classified as critical, was found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W930. Affected is the function slsi_rx_received_frame_ind. Executing a manipulation can lead to heap-based overflow. This vulnerability is registered as CVE-2024-27368. The attack needs to be launched locally. No exploit is available.

Detailsinfo

A vulnerability has been found in Samsung Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920 and Exynos W930 and classified as problematic. This vulnerability affects the function slsi_rx_received_frame_ind. The manipulation with an unknown input leads to a heap-based overflow vulnerability. The CWE definition for the vulnerability is CWE-122. A heap overflow condition is a buffer overflow, where the buffer that can be overwritten is allocated in the heap portion of memory, generally meaning that the buffer was allocated using a routine such as malloc(). As an impact it is known to affect confidentiality. CVE summarizes:

An issue was discovered in Samsung Mobile Processor Exynos Mobile Processor, Wearable Processor Exynos 980, Exynos 850, Exynos 1080, Exynos 1280, Exynos 1380, Exynos 1330, Exynos 1480, Exynos W920, Exynos W930. In the function slsi_rx_received_frame_ind(), there is no input validation check on a length coming from userspace, which can lead to a potential heap over-read.

The advisory is shared for download at semiconductor.samsung.com. This vulnerability was named CVE-2024-27368 since 02/25/2024. The exploitation appears to be easy. The attack needs to be approached locally. The exploitation requires an enhanced level of successful authentication. There are known technical details, but no exploit is available.

There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.

The vulnerability is also documented in the vulnerability database at EUVD (EUVD-2024-24572). VulDB is the best source for vulnerability data and more expert information about this specific topic.

Productinfo

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CPE 2.3info

CPE 2.2info

CVSSv4info

VulDB Vector: 🔍
VulDB Reliability: 🔍

CVSSv3info

VulDB Meta Base Score: 4.1
VulDB Meta Temp Score: 4.1

VulDB Base Score: 2.3
VulDB Temp Score: 2.3
VulDB Vector: 🔍
VulDB Reliability: 🔍

NVD Base Score: 5.5
NVD Vector: 🔍

CNA Base Score: 4.4
CNA Vector (MITRE): 🔍

CVSSv2info

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VulDB Base Score: 🔍
VulDB Temp Score: 🔍
VulDB Reliability: 🔍

Exploitinginfo

Class: Heap-based overflow
CWE: CWE-122 / CWE-119
CAPEC: 🔍
ATT&CK: 🔍

Physical: Partially
Local: Yes
Remote: No

Availability: 🔍
Status: Not defined

EPSS Score: 🔍
EPSS Percentile: 🔍

Price Prediction: 🔍
Current Price Estimation: 🔍

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Threat Intelligenceinfo

Interest: 🔍
Active Actors: 🔍
Active APT Groups: 🔍

Countermeasuresinfo

Recommended: no mitigation known
Status: 🔍

0-Day Time: 🔍

Timelineinfo

02/25/2024 🔍
09/10/2024 +197 days 🔍
09/10/2024 +0 days 🔍
06/13/2025 +276 days 🔍

Sourcesinfo

Vendor: samsung.com

Advisory: semiconductor.samsung.com
Status: Confirmed

CVE: CVE-2024-27368 (🔍)
GCVE (CVE): GCVE-0-2024-27368
GCVE (VulDB): GCVE-100-276880
EUVD: 🔍

Entryinfo

Created: 09/10/2024 07:40
Updated: 06/13/2025 14:13
Changes: 09/10/2024 07:40 (61), 09/10/2024 14:27 (1), 09/12/2024 08:18 (11), 06/13/2025 14:13 (1)
Complete: 🔍
Cache ID: 216::103

VulDB is the best source for vulnerability data and more expert information about this specific topic.

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