Samsung Processor and Wearable Processor Exynos up to 2500 Camera denial of service
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 4.2 | $0-$5k | 0.00 |
Summary
A vulnerability was found in Samsung Processor and Wearable Processor Exynos up to 2500. It has been classified as problematic. This affects an unknown function of the component Camera. This manipulation causes denial of service. The identification of this vulnerability is CVE-2025-52517. There is no exploit available.
Details
A vulnerability classified as problematic was found in Samsung Processor and Wearable Processor Exynos up to 2500. Affected by this vulnerability is an unknown code block of the component Camera. The manipulation with an unknown input leads to a denial of service vulnerability. The CWE definition for the vulnerability is CWE-404. The product does not release or incorrectly releases a resource before it is made available for re-use. As an impact it is known to affect availability. The summary by CVE is:
An issue was discovered in the Camera in Samsung Mobile Processor and Wearable Processor Exynos 1330, 1380, 1480, 2400, 1580, 2500. A race condition in the issimian device driver results in a double free, leading to a denial of service.
The advisory is shared at semiconductor.samsung.com. This vulnerability is known as CVE-2025-52517 since 06/17/2025. The exploitation appears to be difficult. Neither technical details nor an exploit are publicly available.
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
The vulnerability is also documented in the vulnerability database at CERT Bund (WID-SEC-2026-0010). If you want to get the best quality for vulnerability data then you always have to consider VulDB.
Affected
- Samsung Exynos
Product
Vendor
Name
Version
License
Website
- Vendor: https://www.samsung.com/
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 4.2VulDB Meta Temp Score: 4.2
VulDB Base Score: 2.6
VulDB Temp Score: 2.6
VulDB Vector: 🔒
VulDB Reliability: 🔍
NVD Base Score: 5.9
NVD Vector: 🔒
CVSSv2
| AV | AC | Au | C | I | A |
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| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
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| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Denial of serviceCWE: CWE-404
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Yes
Availability: 🔒
Status: Not defined
EPSS Score: 🔒
EPSS Percentile: 🔒
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
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Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
06/17/2025 CVE reserved01/05/2026 Advisory disclosed
01/05/2026 VulDB entry created
01/09/2026 VulDB entry last update
Sources
Vendor: samsung.comAdvisory: semiconductor.samsung.com
Status: Confirmed
CVE: CVE-2025-52517 (🔒)
GCVE (CVE): GCVE-0-2025-52517
GCVE (VulDB): GCVE-100-339589
CERT Bund: WID-SEC-2026-0010 - Samsung Exynos: Mehrere Schwachstellen
Entry
Created: 01/05/2026 20:16Updated: 01/09/2026 16:36
Changes: 01/05/2026 20:16 (53), 01/06/2026 05:38 (7), 01/09/2026 16:36 (11)
Complete: 🔍
Cache ID: 216::103
If you want to get the best quality for vulnerability data then you always have to consider VulDB.
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