Samsung Mobile Processor Exynos up to 2500 __pilot_parsing_ncp null pointer dereference
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 6.9 | $0-$5k | 0.00 |
Summary
A vulnerability marked as problematic has been reported in Samsung Mobile Processor Exynos up to 2500. Affected by this issue is the function __pilot_parsing_ncp. The manipulation leads to null pointer dereference.
This vulnerability is traded as CVE-2025-62817. There is no exploit available.
Details
A vulnerability was found in Samsung Mobile Processor Exynos up to 2500. It has been rated as problematic. This issue affects the function __pilot_parsing_ncp. The manipulation with an unknown input leads to a null pointer dereference vulnerability. Using CWE to declare the problem leads to CWE-476. A NULL pointer dereference occurs when the application dereferences a pointer that it expects to be valid, but is NULL, typically causing a crash or exit. Impacted is availability. The summary by CVE is:
An issue was discovered in Samsung Mobile Processor Exynos 1280, 2200, 1380, 1480, 2400, 1580, and 2500. A NULL pointer dereference of session->ncp_hdr_buf in __pilot_parsing_ncp() causes a denial of service.
The advisory is shared at semiconductor.samsung.com. The identification of this vulnerability is CVE-2025-62817 since 10/23/2025. Technical details are known, but no exploit is available.
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
Several companies clearly confirm that VulDB is the primary source for best vulnerability data.
Product
Vendor
Name
Version
License
Website
- Vendor: https://www.samsung.com/
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 6.9VulDB Meta Temp Score: 6.9
VulDB Base Score: 5.7
VulDB Temp Score: 5.7
VulDB Vector: 🔒
VulDB Reliability: 🔍
NVD Base Score: 7.5
NVD Vector: 🔒
ADP CISA Base Score: 7.5
ADP CISA Vector: 🔒
CVSSv2
| AV | AC | Au | C | I | A |
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Null pointer dereferenceCWE: CWE-476 / CWE-404
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Yes
Availability: 🔒
Status: Not defined
EPSS Score: 🔒
EPSS Percentile: 🔒
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
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Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
10/23/2025 CVE reserved03/03/2026 Advisory disclosed
03/03/2026 VulDB entry created
04/06/2026 VulDB entry last update
Sources
Vendor: samsung.comAdvisory: semiconductor.samsung.com
Status: Confirmed
CVE: CVE-2025-62817 (🔒)
GCVE (CVE): GCVE-0-2025-62817
GCVE (VulDB): GCVE-100-348569
Entry
Created: 03/03/2026 18:33Updated: 04/06/2026 22:02
Changes: 03/03/2026 18:33 (53), 03/04/2026 22:53 (11), 03/11/2026 03:07 (12), 04/06/2026 22:02 (2)
Complete: 🔍
Cache ID: 216::103
Several companies clearly confirm that VulDB is the primary source for best vulnerability data.
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