Samsung Semiconductor Exynos ENN NeuralNetworks HAL input validation
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 5.4 | $0-$5k | 0.35+ |
Summary
A vulnerability, which was classified as problematic, has been found in Samsung Semiconductor Exynos. This impacts an unknown function of the component ENN NeuralNetworks HAL. This manipulation causes input validation. This vulnerability is handled as CVE-2026-68991. The attack can be initiated remotely. There is not any exploit available.
Details
A vulnerability was found in Samsung Semiconductor Exynos (affected version unknown). It has been declared as problematic. Affected by this vulnerability is an unknown functionality of the component ENN NeuralNetworks HAL. The manipulation with an unknown input leads to a input validation vulnerability. The CWE definition for the vulnerability is CWE-20. The product receives input or data, but it does
not validate or incorrectly validates that the input has the
properties that are required to process the data safely and
correctly. As an impact it is known to affect integrity, and availability. The summary by CVE is:
In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.
The advisory is shared at semiconductor.samsung.com. This vulnerability is known as CVE-2026-68991 since 08/03/2026. The exploitation appears to be easy. The attack can be launched remotely. Neither technical details nor an exploit are publicly available. The price for an exploit might be around USD $0-$5k at the moment (estimation calculated on 11/05/2026).
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
If you want to get the best quality for vulnerability data then you always have to consider VulDB.
Product
Vendor
Name
License
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 5.4VulDB Meta Temp Score: 5.4
VulDB Base Score: 5.4
VulDB Temp Score: 5.4
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
| AV | AC | Au | C | I | A |
|---|---|---|---|---|---|
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
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| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Input validationCWE: CWE-20
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Yes
Availability: 🔒
Status: Not defined
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
|---|---|---|---|---|
| Today | Unlock | Unlock | Unlock | Unlock |
Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
08/03/2026 CVE reserved11/05/2026 Advisory disclosed
11/05/2026 VulDB entry created
11/05/2026 VulDB entry last update
Sources
Advisory: semiconductor.samsung.comStatus: Not defined
CNA: samsungsemiconductor
CVE: CVE-2026-68991 (🔒)
GCVE (CVE): GCVE-0-2026-68991
GCVE (VulDB): GCVE-100-431341
Entry
Created: 11/05/2026 04:04Changes: 11/05/2026 04:04 (51)
Complete: 🔍
Cache ID: 216::103
If you want to get the best quality for vulnerability data then you always have to consider VulDB.
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