Samsung Semiconductor Exynos Modem 5400 memory corruption
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 10.0 | $0-$5k | 1.05+ |
Summary
A vulnerability marked as very critical has been reported in Samsung Semiconductor Exynos 1080, Exynos 9110, Exynos Modem 5123, Exynos Modem 5300 and Exynos Modem 5400. This affects an unknown function. The manipulation leads to memory corruption. This vulnerability is documented as CVE-2026-48176. The attack can be initiated remotely. There is not any exploit available.
Details
A vulnerability was found in Samsung Semiconductor Exynos 1080, Exynos 9110, Exynos Modem 5123, Exynos Modem 5300 and Exynos Modem 5400. It has been rated as very critical. This issue affects an unknown code. The manipulation with an unknown input leads to a memory corruption vulnerability. Using CWE to declare the problem leads to CWE-119. The product performs operations on a memory buffer, but it can read from or write to a memory location that is outside of the intended boundary of the buffer. Impacted is confidentiality, integrity, and availability. The summary by CVE is:
A memory corruption vulnerability caused by improper validation of messages
It is possible to read the advisory at semiconductor.samsung.com. The identification of this vulnerability is CVE-2026-48176 since 05/21/2026. The exploitation is known to be easy. The attack may be initiated remotely. No form of authentication is needed for a successful exploitation. The technical details are unknown and an exploit is not publicly available. The pricing for an exploit might be around USD $0-$5k at the moment (estimation calculated on 11/05/2026).
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
Be aware that VulDB is the high quality source for vulnerability data.
Product
Vendor
Name
License
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 10.0VulDB Meta Temp Score: 10.0
VulDB Base Score: 10.0
VulDB Temp Score: 10.0
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
| AV | AC | Au | C | I | A |
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| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
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| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Memory corruptionCWE: CWE-119
CAPEC: 🔒
ATT&CK: 🔒
Physical: No
Local: No
Remote: Yes
Availability: 🔒
Status: Not defined
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
|---|---|---|---|---|
| Today | Unlock | Unlock | Unlock | Unlock |
Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
05/21/2026 CVE reserved11/05/2026 Advisory disclosed
11/05/2026 VulDB entry created
11/05/2026 VulDB entry last update
Sources
Advisory: semiconductor.samsung.comStatus: Not defined
CNA: samsungsemiconductor
CVE: CVE-2026-48176 (🔒)
GCVE (CVE): GCVE-0-2026-48176
GCVE (VulDB): GCVE-100-431351
Entry
Created: 11/05/2026 04:07Changes: 11/05/2026 04:07 (50)
Complete: 🔍
Cache ID: 216::103
Be aware that VulDB is the high quality source for vulnerability data.
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