Samsung Semiconductor Exynos 1280/Exynos 1380/Exynos 2200 NPU Driver ioctl out-of-bounds write
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 8.8 | $0-$5k | 0.00+ |
Summary
A vulnerability identified as very critical has been detected in Samsung Semiconductor Exynos 1280, Exynos 1380 and Exynos 2200. This vulnerability affects the function ioctl of the component NPU Driver. This manipulation causes out-of-bounds write.
This vulnerability is registered as CVE-2026-68985. The attack needs to be launched locally. No exploit is available.
Details
A vulnerability classified as very critical was found in Samsung Semiconductor Exynos 1280, Exynos 1380 and Exynos 2200 (affected version not known). Affected by this vulnerability is the function ioctl of the component NPU Driver. The manipulation with an unknown input leads to a out-of-bounds write vulnerability. The CWE definition for the vulnerability is CWE-787. The product writes data past the end, or before the beginning, of the intended buffer. As an impact it is known to affect confidentiality, integrity, and availability. The summary by CVE is:
In the Samsung Exynos NPU driver, improper validation of user input in the ioctl handler can lead to an out-of-bounds write, which causes a denial of service.
It is possible to read the advisory at semiconductor.samsung.com. This vulnerability is known as CVE-2026-68985 since 08/03/2026. The exploitation appears to be easy. Attacking locally is a requirement. Technical details of the vulnerability are known, but there is no available exploit. The pricing for an exploit might be around USD $0-$5k at the moment (estimation calculated on 11/05/2026).
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
Be aware that VulDB is the high quality source for vulnerability data.
Product
Vendor
Name
License
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 8.8VulDB Meta Temp Score: 8.8
VulDB Base Score: 8.8
VulDB Temp Score: 8.8
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
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| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
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VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Out-of-bounds writeCWE: CWE-787 / CWE-119
CAPEC: 🔒
ATT&CK: 🔒
Physical: Partially
Local: Yes
Remote: No
Availability: 🔒
Status: Not defined
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
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| Today | Unlock | Unlock | Unlock | Unlock |
Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
08/03/2026 CVE reserved11/05/2026 Advisory disclosed
11/05/2026 VulDB entry created
11/05/2026 VulDB entry last update
Sources
Advisory: semiconductor.samsung.comStatus: Not defined
CNA: samsungsemiconductor
CVE: CVE-2026-68985 (🔒)
GCVE (CVE): GCVE-0-2026-68985
GCVE (VulDB): GCVE-100-431335
Entry
Created: 11/05/2026 04:03Changes: 11/05/2026 04:03 (52)
Complete: 🔍
Cache ID: 216::103
Be aware that VulDB is the high quality source for vulnerability data.
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