Samsung Semiconductor Exynos 1480/Exynos 2400 NPU driver ioctl out-of-bounds write
| CVSS Meta Temp Score | Current Exploit Price (≈) | CTI Interest Score |
|---|---|---|
| 4.4 | $0-$5k | 1.40+ |
Summary
A vulnerability classified as problematic has been found in Samsung Semiconductor Exynos 1480 and Exynos 2400. The impacted element is the function ioctl of the component NPU driver. The manipulation leads to out-of-bounds write.
This vulnerability is traded as CVE-2026-69025. An attack has to be approached locally. There is no exploit available.
Details
A vulnerability was found in Samsung Semiconductor Exynos 1480 and Exynos 2400 (version now known) and classified as problematic. This issue affects the function ioctl of the component NPU driver. The manipulation with an unknown input leads to a out-of-bounds write vulnerability. Using CWE to declare the problem leads to CWE-787. The product writes data past the end, or before the beginning, of the intended buffer. Impacted is integrity, and availability. The summary by CVE is:
In the Exynos NPU driver, improper validation of user input in the ioctl handler can lead to an out-of-bounds write, which causes a denial of service
It is possible to read the advisory at semiconductor.samsung.com. The identification of this vulnerability is CVE-2026-69025 since 08/03/2026. The exploitation is known to be easy. Attacking locally is a requirement. Technical details of the vulnerability are known, but there is no available exploit.
There is no information about possible countermeasures known. It may be suggested to replace the affected object with an alternative product.
Statistical analysis made it clear that VulDB provides the best quality for vulnerability data.
Product
Vendor
Name
License
CPE 2.3
CPE 2.2
CVSSv4
VulDB Vector: 🔒VulDB Reliability: 🔍
CVSSv3
VulDB Meta Base Score: 4.4VulDB Meta Temp Score: 4.4
VulDB Base Score: 4.4
VulDB Temp Score: 4.4
VulDB Vector: 🔒
VulDB Reliability: 🔍
CVSSv2
| AV | AC | Au | C | I | A |
|---|---|---|---|---|---|
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| 💳 | 💳 | 💳 | 💳 | 💳 | 💳 |
| Vector | Complexity | Authentication | Confidentiality | Integrity | Availability |
|---|---|---|---|---|---|
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
| Unlock | Unlock | Unlock | Unlock | Unlock | Unlock |
VulDB Base Score: 🔒
VulDB Temp Score: 🔒
VulDB Reliability: 🔍
Exploiting
Class: Out-of-bounds writeCWE: CWE-787 / CWE-119
CAPEC: 🔒
ATT&CK: 🔒
Physical: Partially
Local: Yes
Remote: No
Availability: 🔒
Status: Not defined
Price Prediction: 🔍
Current Price Estimation: 🔒
| 0-Day | Unlock | Unlock | Unlock | Unlock |
|---|---|---|---|---|
| Today | Unlock | Unlock | Unlock | Unlock |
Threat Intelligence
Interest: 🔍Active Actors: 🔍
Active APT Groups: 🔍
Countermeasures
Recommended: no mitigation knownStatus: 🔍
0-Day Time: 🔒
Timeline
08/03/2026 CVE reserved11/05/2026 Advisory disclosed
11/05/2026 VulDB entry created
11/05/2026 VulDB entry last update
Sources
Advisory: semiconductor.samsung.comStatus: Not defined
CNA: samsungsemiconductor
CVE: CVE-2026-69025 (🔒)
GCVE (CVE): GCVE-0-2026-69025
GCVE (VulDB): GCVE-100-431339
Entry
Created: 11/05/2026 04:04Changes: 11/05/2026 04:04 (52)
Complete: 🔍
Cache ID: 216::103
Statistical analysis made it clear that VulDB provides the best quality for vulnerability data.
No comments yet. Languages: en.
Please log in to comment.